Begrippen #-B C-E F-H I-K L-N O-Q R-T U-W X-Z 1-Sample T-Test 1-Sample Z 2-Sample T-Test 20-60-20 regel 5 keer “waarom?” 5 Stappen naar Lean 2-Sample T-Test 5S 7-Punts Schalen 7M 80-20 Principe 8D A3 Aanwijsbare Oorzaken Alpha Risico Anderson-Darling Andon Anova Attribute Data Balanced Scorecard Behoeftepiramide Beslisboom Beta Risico Binaire data Binomial Black Box Bottleneck Box-Cox Transformation Boxplot Business Value Add Capability Analysis C-Chart Cause-and-Effect Diagram Champion Chi-Square Test Continu Verbeteren Continue Data Control Chart Critical to Quality (CTQ) Customer Value Add Dagstart Defect Defective Defects (waste) Design for Six Sigma Design of Experiments DESTEP Factoren Distribution Plot DMADV DMAIC Dotplot Drum-Buffer-Rope (DBR) Edwards Deming Eiji Toyoda Expected Performance Experimental Error Experimentele Data Factorial Design Failure Mode and Effect Analysis Fault Tree Analysis (FTA) First Time Yield (FTY) Fishbone Fitted Line Plot Flow Frederick Taylor Gauge R&R Gauss Kromme Gemba Gemba Kaizen Genchi Genbutsu Genichi Taguchi Grafische Analyse Hansei Hawthorne Effect Heijunka Henry Ford Histogram Historische Data Hoshin Kanri Human Relations Benadering Hypothese Test I-MR Chart IDOV (Identify, Design, Optimize, Validate) Individual Value Plot Input Inventory Ishikawa Diagram Jack Welch Jidoka Joseph Juran Juran’s Kwaliteitstrilogie Just In Time (JIT) Kaizen Kanban KANO-Model Kaoru Ishikawa Kata Kiichiro Toyoda Klantspecificaties Kruskal-Wallis Kwaliteitscontrole Kwaliteitsmanagement Kwaliteitsplanning Kwaliteitsverbetering Lean Lean Black Belt Lean Green Belt Lean Six Sigma Black Belt Lean Six Sigma Green Belt Make-to-Order Make-to-Stock Mann-Whitney Master Black Belt Lean White Belt Lean Yellow Belt Measurement System Analysis (MSA) Minitab Motion Motorola Moving Range Muda Muda Type I Muda Type II Mura Muri Multiple Regression Model Natuurlijke Variantie Niet-Natuurlijke Variantie Nemawashi Noriaki Kano NP-Chart Niet-Normaal Verdeelde Data Normaal Verdeelde Data Observed Performance Ordinale Schaal Output Overprocessing Overproducing Pareto-Principe P-Chart Paired T-Test Perfectie PGSOM Philip Crosby Pilot Plan do Check Act (PDCA) Plan Do Study Act (PDSA) Poisson Poka-Yoke Process Capability Process Maturity Model Process Owner Processen Pugh-Matrix PULL PUSH Quality Circles Quality Function Deployment Random Sampling Rolled Throughput Yield (RTY) Root Cause Analysis Run Chart Scatterplot Scientific Management Scope Sequential Sampling Sigma Niveaus Stratified Sampling Single Minute Exchange of DIE (SMED) SIPOC Six Sigma Skills Stable Operations Standaard Afwijking T-Testen Standaard Deviatie Statistische Procescontrole (SPC) Taiichi Ohno TAKT Test For Equal Variances Theory of Constraints Tmap Value Stream Map (VSM) Transport Theory X & Theory Y Toyota Productie Systeem Time Series Plot TIM WOOD U-Chart Upper Control Limit & Lower Control Limit Upper Specification Limit Variantie Verborgen Fabriek Verdelingsvrije Testen Vijf-Krachten Waardeketen SigmaXL Visueel Management Vital Few X’s Voice of the Customer Waarde Waardestroom Waiting Walter Shewhart Waste WECO-Rules Weibull Verdeling White Box Xbar-R Chart Xbar-S Chart Yamazumi Chart Yield Zero Defects
